secondary ion mass spectrometer

A time-of-flight secondary ion mass spectrometer ( TOF-SIMS), X-ray photoelectron spectroscopy ( XPS), an atomic force microscopy ( AFM), and contact angle measurements were used to characterize the monolayer.

使用时间飞行二次离子质谱仪（TOF-SIMS）、X射线光电子能谱仪（XPS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行了表征。

his main tool is a device called a secondary-ion mass spectrometer.

他的主要工具是一种叫做二次离子质谱仪的装置。

particle analysis in nuclear safeguards and secondary ion mass spectrometer

核保障的微粒分析与二次离子质谱仪

The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS), atomic force microscopy ( AFM) and contact angle measurement, and the tribology properties of the FTE SAMs were measured by the Olympus head/ disk interface reliability measurement system.

应用时间飞行二次离子质谱仪（TOF-SIMS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行表征。通过Olympus磁头磁盘界面可靠性测试系统对FTE自组装膜的摩擦学性能进行研究。